Scientists from King Abdullah University of Science and Technology (KAUST) and Solar Energy Research Institute of Singapore (SERIS) have examined the potential-induced degradation (PID) susceptibility of perovskite-silicon tandem devices fabricated in their lab. They exposed tandem cell devices to PID stress and found that they lost as much as 50% of their initial performance after just one day. This led the team to assess that more work needs to be done on the issue before perovskites can be commercialized and deployed at scale.
Research on perovskite solar cells' stability challenges has largely focused on the material’s sensitivity to moisture, high temperatures, and other environmental conditions. Potential-induced degradation (PID), caused by currents leaking from the cell and driving various damaging mechanisms, has long been a threat to performance in silicon PV modules, but has so far been much less explored in emerging PV technologies such as perovskite.