Researchers achieve air‑stable tin perovskite p‑type transistors via volatile surface reconstruction
Researchers from POSTECH, SKKU and UESTC have developed air‑stable tin‑based perovskite p‑type transistors using volatile surface reconstruction by treating CsSnI₃ with potassium acetate, removing defect‑forming tin ions and creating a protective KI layer. The devices show top‑level hole mobility and on/off ratio, remain stable in air and at high temperature, and may be used in future memory and display electronics.
Tin (Sn²⁺) halide perovskites are promising lead‑free materials for future electronics because their bandgaps can be tuned and they conduct charge efficiently, but the tin at the surface is easily oxidized in air. Undercoordinated Sn²⁺ sites tend to oxidize to Sn⁴⁺, causing unwanted self‑doping and defects that block charge flow, so conventional tin‑based perovskite transistors can fail within minutes under ambient conditions. In these devices, unreacted tin ions that never fully joined the crystal remain on the surface and act as starting points for oxidation and degradation. To overcome this, the researchers implemented “volatile surface reconstruction”.