New AFM-based method measures true durability of perovskite nanocrystals
Researchers at ITMO University, Alferov University and Harbin Engineering University have developed a new method for directly and accurately measuring the mechanical durability of individual halide perovskite nanoparticles, a property that is central to perovskite-based flexible electronics such as foldable displays, pressure sensors, and solar cells but has been difficult to measure reliably at the nanoscale.
Perovskite nanoparticles are attractive for flexible devices because they absorb and emit light efficiently, but they remain mechanically fragile: repeated bending or compression causes microcracks to accumulate, eventually causing devices to fail. Assessing how well a nanoparticle will hold up under real-world flexing requires measuring its Young's modulus, a quantity describing how strongly a material resists deformation, where a lower modulus generally means better suitability for foldable applications. Conventional methods measure this property with indentors, hard tips pressed into a sample, but even the smallest indentors are far larger than a single nanoparticle, making it effectively impossible to apply controlled, direct pressure to one nanocrystal with standard equipment.

