Scientists at Shaanxi Normal University in China have demonstrated a new, simpler technique for manufacturing tin-containing perovskite solar cells (PSCs).
To improve PSC device stability, researchers tend to focus on improving either the perovskite layer or the tin-based electron transport layer (ETL) of the PSC. The new research, however, uses a new dual passivation technique that stabilizes both tin in the ETL and elements in the perovskite film in one step.
Europium ions are distributed throughout the two layers and at their interface, increasing the electrical conductivity. At the same time they act to reduce trap densities in the perovskite to increase the open-circuit voltage of the PSC.
These tin-containing PSCs reportedly demonstrated a PCE of 20.14%. Most notably, an unsealed device degraded by only 13% after exposure to ambient atmosphere for 84 days.
Despite this PCE not being quite as high as other tin-based PSCs currently being researched, these results demonstrate the possibility of a one-step production technique for improving PSC performance that could greatly reduce the cost of PSC engineering and ultimately improve their commercial viability.